The article “A test platform for dependability analysis of SoCs exposed to EMI and radiation” by Juliano Benfica, Ph.D., Letícia Maria Bolzani Poehls, Ph.D., and Fabian Vargas, Ph.D., professors in the Graduate Program in Electrical Engineering at the School of Engineering of the Pontifical Catholic University of Rio Grande do Sul ( Porto Alegre, Brazil), Dr. José Lipovetzky, professor at the School of Engineering of the University of Buenos Aires; Dr. Ariel Lutenberg, Coordinator of the Embedded Systems Laboratory at the School of Engineering of the University of Buenos Aires; Eng. Edmundo Gatti, Delegate of the Electromagnetic Compatibility Group at the National Institute of Industrial Technology (Buenos Aires); and Fernando Hernández, a professor of telecommunications at the School of Engineering, was published in the journal “Journal of Electronic Testing: Theory and Applications.” The publication, edited by Springer Science+Business Media, was published in December 2012 (volume 28, issue 6).