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Presentation of a paper at the “9th International Workshop on Electromagnetic Compatibility of Integrated Circuits”

December 30, 2013
The paper “Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMI” was presented at the “9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC COMPO 2013),” organized by the Graduate School of Engineering at Kyoto University (Japan) from December 15 to 18, 2013.

The authors are Christofer Oliveira, a researcher at the Pontifical Catholic University of Rio Grande do Sul in Porto Alegre; Juliano Benfica, Ph.D.; Letícia Maria Bolzani Poehls, Ph.D.; and Fabián Vargas, Ph.D., professors in the Graduate Program in Electrical Engineering at that university; Dr. José Lipovetzky, Professor at the School of Engineering, University of Buenos Aires; Dr. Ariel Lutenberg, Coordinator of the Embedded Systems Laboratory at the School of Engineering, University of Buenos Aires; Edmundo Gatti, Engineer, Delegate of the Electromagnetic Compatibility Group at the National Institute of Industrial Technology (Buenos Aires); Fernando Hernández, Professor of Telecommunications at the School of Engineering, and Dr. Alexandre Boyer, Researcher at the Laboratory of Systems Analysis and Architecture—National Center for Scientific Research at the University of Toulouse (France).